SN74BCT8373ADWRE4 • 品牌、价格
| 元器件型号 |
厂商 |
描述 |
数量 |
价格 |
| SN74BCT8373ADWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE LATCH 24SOIC |
0 |
|
| SN74BCT8245ANTE4 |
Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-DIP |
0 |
|
| SN74BCT8240ANTE4 |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-DIP |
0 |
|
| SN74BCT8240ADWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
0 |
|
| SN74BCT29854DWRE4 |
Texas Instruments |
IC TRANSCEIVER 1-9BIT 24SOIC |
0 |
|
| SN74BCT29854DWE4 |
Texas Instruments |
IC TRANSCEIVER 1-9BIT 24SOIC |
0 |
|
| SN74AS181ANTE4 |
Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-PDIP |
0 |
|
| SN74AS181ADWRE4 |
Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-SOIC |
0 |
|
| SN74AS181ADWR |
Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-SOIC |
0 |
|
| SN74AS181ADWE4 |
Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-SOIC |
0 |
|
SN74BCT8373ADWRE4 • PDF参数
| 类别: |
集成电路 (IC)
|
| 逻辑类型: |
扫描测试设备，带 D 型锁存器
|
| 电源电压: |
4.5 V ~ 5.5 V
|
| 位数: |
8
|
| 工作温度: |
0°C ~ 70°C
|
| 安装类型: |
表面贴装
|
| 封装/外壳: |
24-SOIC（0.295"，7.50mm 宽）
|
| 供应商设备封装: |
24-SOIC
|
| 包装: |
带卷 (TR)
|