74GTLP22034DGGRG4 • 品牌、价格
| 元器件型号 |
厂商 |
描述 |
数量 |
价格 |
| 74GTLP22034DGGRG4 |
Texas Instruments |
IC LVTTL/GTLP ADJ TXRX 48TSSOP |
0 |
|
| 74GTLP22033DGVRG4 |
Texas Instruments |
IC LVTTL/GTLP ADJ TXRX 48TVSOP |
0 |
|
| 74GTLP2034DGGRG4 |
Texas Instruments |
IC LVTTL/GTLP ADJ TXRX 48TSSOP |
0 |
|
| 74ABT18640DGGRG4 |
Texas Instruments |
IC SCAN TEST DEVICE 56TSSOP |
0 |
|
| CD4089BPWE4 |
Texas Instruments |
IC BINARY RATE MULTIPLR 16-TSSOP |
0 |
|
| 74SSTL16857DGGRE4 |
Texas Instruments |
IC REG BUFFER 14BIT 48-TSSOP |
0 |
|
| 74GTLP22034DGVRE4 |
Texas Instruments |
IC 8BIT REGISTER TXRX 48-TVSOP |
0 |
|
| 74GTLP22034DGGRE4 |
Texas Instruments |
IC 8BIT REGISTER TXRX 48-TSSOP |
0 |
|
| 74GTLP22033DGVRE4 |
Texas Instruments |
IC 8BIT REGIST TXRX 48-TVSOP |
0 |
|
| 74GTLP2034DGGRE4 |
Texas Instruments |
IC 8BIT REGIST TXRX 48-TSSOP |
0 |
|
| 74ABT18640DGGRE4 |
Texas Instruments |
IC 18BIT INV BUS TXRX 56-TSSOP |
0 |
|
| SN74LS31DRE4 |
Texas Instruments |
IC HEX DELAY ELEMENT 16-SOIC |
0 |
|
| SN74LS283DRE4 |
Texas Instruments |
IC BIN FULL 4BIT ADD CAR 16-SOIC |
0 |
|
| SN74ACT1284PWE4 |
Texas Instruments |
IC 7BIT BUS INTERFC 3ST 20-TSSOP |
0 |
|
| SN74ABT8952DLR |
Texas Instruments |
IC SCAN TESST DEVICE 28-SSOP |
0 |
|
| SN74ABT8652DWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
| SN74ABT8652DLRG4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
0 |
|
| SN74ABT8652DLR |
Texas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
0 |
|
| SN74ABT8646DWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
| SN74ABT8646DWR |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
| SN74ABT8543DWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
| SN74ABT8543DWR |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
0 |
|
| SN74ABT18640DLRG4 |
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 56SSOP |
0 |
|
| SN74ABT18504PMRG4 |
Texas Instruments |
IC SCAN TEST DEVICE 20BIT 64LQFP |
0 |
|
| SN74ABT18504PMR |
Texas Instruments |
IC SCAN TEST DEVICE 20BIT 64LQFP |
0 |
|
| SN74BCT8374ANTE4 |
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-DIP |
0 |
|
| SN74BCT8374ADWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
0 |
|
| SN74BCT8373ADWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE LATCH 24SOIC |
0 |
|
| SN74BCT8245ANTE4 |
Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-DIP |
0 |
|
| SN74BCT8240ANTE4 |
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-DIP |
0 |
|
74GTLP22034DGGRG4 • PDF参数
| 类别: |
集成电路 (IC)
|
| 逻辑类型: |
LVTTL-TO-GTLP 可调信号沿速率寄存收发器
|
| 电源电压: |
3.15 V ~ 3.45 V
|
| 位数: |
8
|
| 工作温度: |
-40°C ~ 85°C
|
| 安装类型: |
表面贴装
|
| 封装/外壳: |
48-TFSOP（0.240"，6.10mm 宽）
|
| 供应商设备封装: |
48-TSSOP
|
| 包装: |
带卷 (TR)
|